¹College of Computer Science and Technology, Nanjing University of Science & Technology, Nan Jing, China
²College of software engineering, East China Institute of Technology, Nan Chang, China

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Abstract—Combined with image processes under microbeam analysis,and based on analyzing the feature of electron probe deeply,the paper presents an optimized method based on Contourlet-lifting wavelet transform and regional variance.firstly,to get the fused image before Contourlet fusion based on regional variance,and then the processing image and the target image will be fused under lifting wavelet transform based on regional variance,finally get the fusion result. The experiment shows that,the processed multi-source electron probe image is much more comprehensive and accurate than any other single source image,and it will facilitate further processing and analyzing images such as micro-surface target recognition and impurity extraction.

Index Terms—image fusion, Contourlet transform, lifting wavelet transform, regional variance, Electron probe analysis.

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Cite: Li xiang, Zhan Xuan, "A New EPMA Image Fusion Algorithm based on Contourlet-lifting Wavelet Transform and Regional Variance," Journal of Software vol. 5, no. 11, pp. 1200-1207, 2010.