¹School of Software, Nangchang Hangkong University, Nanchang, Jiangxi, China
²Key Laboratory of Nondestructive Test (Ministry of Education) Nangchang Hangkong University, Nanchang, Jiangxi, China
³National Key Laboratory of Science and Technology on Avionics System Integration, Shanghai, China

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Abstract—Line segments are ordinary in industrial scene, accurate line segments matching is a key step for many applications, such as 3-D reconstruction. A matching method based on epipolar-line constraint and line segment features is proposed. Firstly, the points on line segments between image pairs are matched by epipolar-line constraint. Secondly, geometric descriptor and gray value descriptor are used to describe the line segment features, then the two descriptors are combined into a feature vector, and Euclidean distance between vectors is used to achieve fine match. Experiment results show that the proposed method is accurate and fast.

Index Terms—epipolar-line constraint; line segment featrurs; line segments matching

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Cite: Jie-xian Zeng, Sheng Yu, Xiang Fu, Chao-xia Li, "A Line Segments Matching Method based on Epipolar-line Constraint and Line Segment Features," Journal of Software vol. 6, no. 9, pp. 1746-1754, 2011.